Method of etching silicon substrate at different etching rates for different planes of the silicon to form an air bridge

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United States of America Patent

PATENT NO 5683546
SERIAL NO

08139696

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention is for enlarging a freedom of layout including an air bridge pattern and enhancing the availability for various purposes. A mask layer including an air bridge pattern is formed on a (100) plane of a silicon substrate, isotropic etching is carried out until a point of intersection between tangents of a peripheral curved plane comes to under the air bridge pattern plane, and then an air bridge is formed by means of anisotropic etching.

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Patent Owner(s)

  • RICOH SEIKI COMPANY, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Manaka, Junji Tokyo, JP 21 390

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