Scan test circuit using fast transmission gate switch
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United States of America Patent
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Sep 30, 1997
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N/A
app pub date -
Oct 17, 1996
filing date -
Sep 16, 1993
priority date (Note) -
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Abstract
A fast transmission, integrated circuit switching device responsive to at least one external on/off control signal, and including a first input/output node, and a second input/output node, the switching device operative to pass or block the bidirectional transmission of external data signals between the first node and the second node, the switching device comprising a bidirectional field-effect transistor; a first scan cell; and a second scan cell; whereby input and output data signals of the switching device may be sensed and stored.
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