Method and apparatus for real time defect inspection of metal at elevated temperature
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United States of America Patent
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Aug 5, 1997
Grant Date -
N/A
app pub date -
Feb 2, 1995
filing date -
Feb 2, 1995
priority date (Note) -
Expired
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Abstract
A system for detecting, in real time, the existence, depth, extent, and type of a defect in an above ambient temperature object which has been formed by working or other heat input. Such defect detection is performed by analyzing IR emissions from the product, and from a defect site in particular, in order to assess the characteristics of the detected defect. The defect observables are then compared with known defect training data in order to characterize the defect as to type, depth and extent.
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