Apparatus and method for non-destructive testing of structures
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United States of America Patent
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May 27, 1997
Grant Date -
N/A
app pub date -
Dec 1, 1995
filing date -
Jun 4, 1993
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for non-destructive testing of the load bearing characteristics of a structure are disclosed. An interferometer is supported by a beam which is supported away from the surface of the structure to be tested. The interferometer is used to measure a quantity which varies with the distance between the interferometer and a reflecting means supported on the location to be tested. The reflecting means is supported in such a manner as to move responsively with deformations to the said location, and is typically attached to a probe which is urged against the said location. Preferably a force is applied or varied near the location to be tested and comparisons are made over time or as the said force varies. Such a system does not damage the structure, and does not require complicated equipment or processing.
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