Connector inspection device
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United States of America Patent
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May 6, 1997
Grant Date -
N/A
app pub date -
Apr 25, 1995
filing date -
Jun 10, 1994
priority date (Note) -
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Abstract
An inspection device for determining the integrity of electrical circuits in a connector having one or more electrical terminals therein. The test device carries probes, corresponding in number and location to the terminals, and the probes and the terminals are at an angle to each other so that, when in test position, the tips of the probes contact a portion of the terminals other than that at which a mating connector would be inserted. This eliminates the possibility of distortion or wear on fragile connecting surfaces.
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