Plasma etch process and TiSi.sub.x layers made using the process

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United States of America Patent

PATENT NO 5627105
SERIAL NO

08044869

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Abstract

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A method for making an improved metal silicide layer on a silicon substrate by plasma bombardment of the substrate with Ne ions to remove the native oxide without damage or significant implantation of Ne atoms into said silicon, depositing a metal layer over the Ne etched surface and then rapidly thermally causing the metal layer to react with the underlying silicon.

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Patent Owner(s)

Patent OwnerAddress
NOVELLUS SYSTEMS INC4650 CUSHING PARKWAY FREMONT CA 94538

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Day, Mary E Los Altos, CA 5 68
Delfino, Michelangelo Los Altos, CA 20 305
Tsai, Wilman Cupertino, CA 63 1257

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