Interferometric method for optically testing an object with an aspherical surface

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United States of America Patent

PATENT NO 5625454
SERIAL NO

08449393

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Abstract

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A method for testing an object with an aspherical surface. Based on the theory that an aspherical surface is composed of a plurality of spherical surfaces with different radii, the method tests the profile of said aspherical object by positioning the focus of an interferometer on the curvature centers of the plurality of spherical surfaces, recording the relative displacement of the aspherical object and the referenced spherical surfaces and calculating the aberrations therebetween.

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Patent Owner(s)

Patent OwnerAddress
VIA TECHNOLOGIES INC8F 535 CHUNG-CHENG ROAD HSIN-TIEN TAIPEI 231

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, June-Jei Taipei, TW 87 549
Lin, Chie-Ching Taichung, TW 8 71

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