Apparatus for evaluating measuring values
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United States of America Patent
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Apr 15, 1997
Grant Date -
N/A
app pub date -
Apr 12, 1995
filing date -
Apr 14, 1994
priority date (Note) -
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Abstract
An apparatus evaluates measuring values from a laminar material, wherein the laminar material is moving in a single plane in a predetermined direction, the laminar material being moved also being under test. The apparatus comprises a measuring platform which is being moved traverse to a direction of movement of the laminar material. Further, the measuring platform is tiltable about an axis which is normal to a plane of the laminar material, an angle of tilt (a) being determined by a traversing velocity (v.sub.t) of the measuring platform and velocity (v.sub.b) of the predetermined direction of the laminar material. A plurality of separated sensors and radiation emitters are mounted on the measuring platform, and in conjunction with the angle of tilt cause, the measuring valves acquired from the different sensors to be from the same measuring spot of the laminar material.
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