Automatic optical inspection system having a weighted transition database
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United States of America Patent
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Mar 4, 1997
Issued Date -
N/A
app pub date -
Nov 1, 1995
filing date -
Oct 26, 1993
priority date (Note) -
Expired
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Abstract
A method and apparatus used with a printed circuit board (PCB) defect detection system generates a reference database image of the PCB having tolerances for each individual PCB feature, The invention is characterized by a tolerance database of at least three states in which each color is weighted and adjacent pixels are grouped into arrays or 'bins'. An error signal is generated when the sum of the pixel weights in a bin exceeds a preselected threshold.
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