High resolution measurement of a thickness using ultrasound

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United States of America Patent

PATENT NO 5596508
SERIAL NO

08350956

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Apparatus (10) for measuring physical properties of a tube (T). A pulse generator (12) generates an electrical pulse having predetermined characteristics. Transducers (20a, 20b) convert the pulse to an ultrasonic waveform (W) and propagate the waveform at the tube from different directions. Resulting echoes (E1-E3) are converted into electrical response pulses. Another transducer (24a) propagates a similar waveform at a reference object (B) and converts an echo therefrom into a reference electrical response pulse which is combined with each of the other response pulses. Receivers (28a, 28b) receive the combined response pulses and convert them to digital data stored in a memory (32). A processor (36) reconstructs each combined waveform and determines from each reconstruction a value representing a physical characteristic of the tube. This involves performing a 'real time' evaluation of the combined waveform to determine if it meets threshold criteria. If it does, a linear interpolation and finite impulse response on the digital data is performed to precisely measure time of flight (TOF). A processor (54) mathematically combines respective TOF values derived from a reconstruction to ascertain other physical characteristics of the tube. Each characteristic value is compared with a predetermined set of limits to determine if a measured value fall within the limits. Results of the comparison are displayed to an operator, and a permanent record of the values is made.

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Patent Owner(s)

Patent OwnerAddress
GE INSPECTION TECHNOLOGIES LLC50 INDUSTRIAL PARK ROAD LEWISTOWN PA 17044

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cuffe, John M County of Centre, GB 4 46

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