Birefringence distribution measuring method

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United States of America Patent

PATENT NO 5587793
SERIAL NO

08470157

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Abstract

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A sample is placed between a circular polarizer and an analyzer in an optical path between a monochromatic light source and a two-dimensional optical receiver. Parallel beams emitted from the monochromatic light source are converted into circularly polarized light by the circular polarizer. After transmitting the sample, the light is guided to the analyzer. While rotating the analyzer about the axis of the beams, image data are detected by optical receiver at a step of a regular rotation angle, and the detected image data are sampled to be sent to an image processing device in the next stage. On the basis of the image data, an operation is conducted on each pixel to obtain a relative phase difference due to birefringence of the sample, the two-dimensional birefringence distribution including the sign of the relative phase difference, and also the principal axis direction.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC CO LTDKAWASAKI COUNTY OF KANAGAWA CITY JAPAN KAWASAKI-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akatsuka, Masanori Osaka, JP 5 33
Izawa, Yasukazu Suita, JP 7 61
Nakai, Sadao 6-45, Kitakasugaoka 3-chome, Ibaragi-shi, Osaka, JP 11 79
Ohmi, Masato Toyonaka, JP 1 6
Yamanaka, Chiyoe Osaka, JP 5 81
Yamanaka, Masanobu Minoo, JP 5 48
Yonezawa, Yoshiyuki Kawasaki, JP 23 250

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