Control system for a grain dryer and probe mounting apparatus therefor
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United States of America Patent
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-
Nov 5, 1996
Issued Date -
N/A
app pub date -
Apr 25, 1995
filing date -
Nov 26, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A control system (80-1, 80-2) is provided for a grain dryer (10) having a path (22, 24) along which grain is conveyed from an entry opening (28) between first (12, 14) and second (18, 20) walls provided with second openings through which drying air can flow. A source (16) on the side of the first wall opposite the grain provides a flow of air through the first wall, through the grain and through the second wall to dry the grain. The grain dryer (10) further comprises metering rolls (30, 32) between the walls (12, 18, 14, 20) adjacent the end opposite the entry opening (28) to control the movement of the grain along the path (22, 24). The control system includes a first moisture probe (80-1) positioned remote from the metering rolls (30, 32), a second moisture probe (80-2) positioned adjacent the metering rolls (30, 32), and a microcomputer (150). The first (80-1) and second (80-2) moisture probes and the metering rolls (30, 32) are coupled to the microcomputer (150) for control of the metering rolls (30, 32) based upon the outputs of the moisture probes (80-1, 80-2).
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