CMOS buffer circuit having power-down feature
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 29, 1996
Grant Date -
N/A
app pub date -
Aug 25, 1995
filing date -
Aug 25, 1995
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The gate of a P-channel pull-up transistor connected between an input node and a supply voltage in a buffer circuit is coupled to a test node. An N-channel pull-down transistor is connected between the input node and ground and has a gate connected to the test node. A logic low signal provided to the test node allows the circuit to operate normally. During test mode, a logic high signal is provided to the test node to turn off the P-channel pull-up transistor and thus prevent DC current flow in the circuit via the pull-up transistor. This logic high signal also turns on the pull-down transistor and, by shorting the input node to ground potential, prevents any other DC crossover currents from flowing in the circuit. Thus, during test mode, quiescent current flow resulting from small manufacturing defects in the circuit are obscured by larger DC currents and, as a result, may be readily measured to detect the presence of such small manufacturing defects.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully