Non-contact resistivity measurement apparatus and method using femtosecond laser pulses to create an electron flow
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 8, 1996
Grant Date -
N/A
app pub date -
Mar 31, 1995
filing date -
Mar 31, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Apparatus and method for measuring the resistivity of a material without contacting or damaging the material, using a current and voltage meter connected to a first probe and a second probe. The probes are placed adjacent the material and in spaced relation to the material, a first ultraviolet laser beam having femtosecond pulses is focused onto the first probe such that the first probe emits electrons toward the material, and a second ultraviolet laser beam having femtosecond pulses is focused onto the material such that the material emits electrons toward the second probe. A voltage and a closed current loop are thus created. The current and voltage meter measures the current and voltage to obtain current and voltage readings, and the current and voltage readings are used to determine the resistivity of the material.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully