Mass spectrometer and electron impact ion source thereof
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United States of America Patent
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Oct 1, 1996
Grant Date -
N/A
app pub date -
May 15, 1995
filing date -
May 17, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An enclosed ion source for generating substantially monoenergetic ions from a gaseous sample comprises a chamber into which the gaseous sample is introduced and which is substantially enclosed by a source block having two electron entrance apertures formed in it and by a source plate having one ion extraction aperture formed in it. Two filaments are disposed outside the chamber and adjacent the electron entrance apertures. The electron impact ion source is characterized by the provision of an electrically conductive shield which is disposed within the chamber and which defines an equipotential region. The electrons, generated from a heated filament, pass into the chamber through one of the electron entrance apertures. The shield allows the passage of molecules of the gaseous sample and the electrons into the equipotential region, so that electron impact ionization of at least some of the sample occurs in the equipotential region. The electron impact source may be incorporated into a conventional mass spectrometer.
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