Multi-Parameter eddy current measuring system with parameter compensation technical field
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United States of America Patent
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Jul 30, 1996
Grant Date -
N/A
app pub date -
Apr 6, 1995
filing date -
Apr 6, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
This invention uses a single eddy current coil to measure multiple parameters of conductive target simultaneously using a single fixed frequency. For example, the system consisting of the sensor coil, connecting cable, and signal conditioning electronics, can measure the thickness of a target and the distance of the target from the coil. Alternatively, it could simultaneously measure the distance of the target to the coil, i.e. lift-off, and one of the electrical properties of the target, such as the resistivity. The present system is useful in material characterization of targets where the lift-off information can be used to correct for any lift-off induced error in the apparent resistivity. In general, it can determine any pair of two characteristics of the target/sensor relationship simultaneously. This invention provides significant improvement in accuracy and flexibility of eddy current sensors and can be manufactured at a low cost due to the use of a single coil and a single fixed frequency in the signal conditioning electronics. An alternative sensor configuration utilizing two sensors differentially to produce a cladding insensitive--displacement measurement is also contemplated by the present invention.
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