Automatic garment inspection and measurement system
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United States of America Patent
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Jun 25, 1996
Grant Date -
N/A
app pub date -
Aug 11, 1993
filing date -
Aug 11, 1993
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An automatic garment inspection and measurement system can create a two-dimensional or three-dimensional electronic representation of an object. This electronic representation can then be combined with other electronic representations to create a database of measurements from which standard patterns can be generated for use in manufacturing garments. The electronic representation can also be used to compare the manufactured object it represents to an ideal representation in order to determine if the object's measurements are within a predetermined tolerance of the ideal representation. A machine vision system is used to capture an image of the object and convert that image into a digital representation which can then be added to a database to be used to compile an ideal pattern or can be compared to an already existing ideal image to determine if the object is the correct size.
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