Method of calibrating a radiological system and of measuring the equivalent thickness of an object
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 18, 1996
Issued Date -
N/A
app pub date -
Nov 20, 1992
filing date -
Jun 9, 1989
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The calibration method consists in measuring the efficiency D of a detector cell placed behind the object as a function of various phantom thicknesses E.sub.p and various X-ray tube supply voltages V.sub.m. These measurements enable an analytic model D=f(V.sub.m, E.sub.p) to be determined describing the resulting curves. The inverse function of this analytic model can be used for calculating thickness E.sub.p as a function of the measured efficiency D and the known supply voltage V.sub.m.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully