Thermal desorption gas spectrometer

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United States of America Patent

PATENT NO 5528032
SERIAL NO

08210761

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Abstract

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In a thermal desorption gas spectrometer in which samples placed on a sample stage within a vacuum chamber are heated by irradiation with infrared rays, and in which mass is analyzed by detecting desorbed gas by means of a mass spectrometer, there is provided a processing circuit which takes in the electrical signal that is output by the mass spectrometer. The intensity of this signal is continuously recorded, for each mass of a detected substance, as a function of temperature (or of elapsed time) from the start of heating of the sample to the temperature at which the amount of desorbed gas from the sample becomes extremely small. This signal intensity is integrated with respect to temperature (or time) for each mass. The absolute value of the number of molecules can be obtained by comparing these integrated values with the value obtained for a standard sample. A single reference can be set for these measurement results, and an absolute value can be given for the measurement results for each kind of gas that desorbs in the vacuum.

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Patent Owner(s)

Patent OwnerAddress
ESCO LTDNISHIKUBO 1-30-10 MITAKA-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Uchiyama, Taizo Hachioji, JP 2 456

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