Test disk having defect patterns uniformly distributed in recording areas
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 11, 1996
Grant Date -
N/A
app pub date -
Jul 26, 1994
filing date -
Jul 30, 1993
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test disk having defect patterns uniformly arranged in recording areas is produced by a production method including: producing a stamper having a plurality of data pits in accordance with test data signals recorded on the test disk; radiating laser light to the stamper by using a laser system so that a plurality of small patterns are produced at laser-light exposed portions along first lines on the stamper, to form interruptions, which interrupt the data pits on the stamper, in accordance with the small patterns; and performing injection molding with plastic material to produce a disk based on the stamper, so that the disk has interruptions corresponding to the interruptions of the stamper, and the interruptions of the disk are included in a recording layer of the disk.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully