Vertical probe tester card with coaxial probes

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5525911
SERIAL NO

08283900

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A probe card is electrically connected to a tester, electrically contacted and connected to circuits to be tested, and used to transmit test signals between the tester and the circuits. It includes a plate assembly having a printed board and an earth plate insulated from each other. Probe assemblies are supported by the plate assembly and are substantially vertically contacted at their foremost ends with pads of the circuits to be tested. Each probe assembly includes a center conductor having a sharpened tip contacted with the pad of the circuit to be tested. A holder conductor shrouds the center conductor while leaving the front end portion thereof not enclosed, and having electrical continuity with the center conductor. A dielectric shrouds the holder conductor, a peripheral conductor coaxially arranged around the holder conductor with the dielectric interposed between them, and a sheath enclosing the peripheral conductor. The upper end of the holder conductor is electrically connected to a circuit on the printed board while the upper end of the peripheral conductor is electrically connected to a circuit on the earth plate.

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First Claim

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325
JUNKOSHA CO LTD2-25-25 MIYASAKA SETAGAYA-KU TOKYO 156 YAMANASHI 407
TOKYO ELECTRON YAMANASHI LIMITED2381-1 KITAGEJO FUJII-MACHI NIRASAKI-SHI YAMANASHI 407

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kanai, Shoichi Shimonita-machi, JP 3 74
Marumo, Hiroshi Kofu, JP 2 89
Negishi, Nobuyuki Tokyo, JP 25 343
Yamashita, Satoru Kofu, JP 18 344

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