Vertical probe tester card with coaxial probes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 11, 1996
Grant Date -
N/A
app pub date -
Aug 4, 1994
filing date -
Aug 4, 1993
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe card is electrically connected to a tester, electrically contacted and connected to circuits to be tested, and used to transmit test signals between the tester and the circuits. It includes a plate assembly having a printed board and an earth plate insulated from each other. Probe assemblies are supported by the plate assembly and are substantially vertically contacted at their foremost ends with pads of the circuits to be tested. Each probe assembly includes a center conductor having a sharpened tip contacted with the pad of the circuit to be tested. A holder conductor shrouds the center conductor while leaving the front end portion thereof not enclosed, and having electrical continuity with the center conductor. A dielectric shrouds the holder conductor, a peripheral conductor coaxially arranged around the holder conductor with the dielectric interposed between them, and a sheath enclosing the peripheral conductor. The upper end of the holder conductor is electrically connected to a circuit on the printed board while the upper end of the peripheral conductor is electrically connected to a circuit on the earth plate.
First Claim
Family
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| TOKYO ELECTRON LIMITED | 3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325 | |
| JUNKOSHA CO LTD | 2-25-25 MIYASAKA SETAGAYA-KU TOKYO 156 YAMANASHI 407 | |
| TOKYO ELECTRON YAMANASHI LIMITED | 2381-1 KITAGEJO FUJII-MACHI NIRASAKI-SHI YAMANASHI 407 |
International Classification(s)
Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Kanai, Shoichi | Shimonita-machi, JP | 3 | 74 |
| Marumo, Hiroshi | Kofu, JP | 2 | 89 |
| Negishi, Nobuyuki | Tokyo, JP | 25 | 343 |
| Yamashita, Satoru | Kofu, JP | 18 | 344 |
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Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|
| Fee | Large entity fee | small entity fee | micro entity fee |
|---|---|---|---|
| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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