LC element, semiconductor device and LC element manufacturing method

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United States of America Patent

PATENT NO 5500552
SERIAL NO

08282046

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Abstract

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An LC element, semiconductor device and a manufacturing method thereof whereby a channel 22 is formed by applying a voltage to a gate electrode 10 having a predetermined shape formed on a p-Si substrate 30 via an insulation layer 26, whereby a connection is formed between a first diffusion region 12 and a second diffusion region 14 formed at separated positions near the surface of the p-Si substrate 30; both the channel 22 and gate electrode 10 function as inductors, and between these a distributed constant type capacitor is formed, and possessing excellent attenuation characteristics over a wide band. This LC element and semiconductor device can be easily manufactured by using MOS manufacturing technology; in the case of manufacturing as a portion of a semiconductor substrate, component assembly work in subsequent processing can be omitted. Also these can be formed as a portion of an IC or LSI device.

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Patent Owner(s)

Patent OwnerAddress
NIIGATA SEIMITSU CO LTD5-13 NISHISHIROCHO 2-CHOME JOETSU-SHI NIIGATA 943-0834

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ikeda, Takeshi Tokyo, JP 331 3847
Nakanishi, Tsutomu Tokyo, JP 86 704
Okamoto, Akira Ageo, JP 180 1555

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