Embedded fuse resistance measuring circuit
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United States of America Patent
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Sep 26, 1995
Grant Date -
N/A
app pub date -
Feb 1, 1994
filing date -
Feb 1, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention provides for an embedded test circuit in an integrated circuit. The integrated circuit has a plurality of conducting line segments and fuse elements therebetween with each fuse element selectively connectable in series through the crossing line segments and programming circuits between a pair of programming terminals. Each fuse element is also associated with a pair of test lines with each test line connected to one of the line segments having the fuse element between the test lines. Each test line pair is selectively connectable to a pair of test terminals. The resistance of a selected fuse element is measured by selectively passing a current between the first and second programming terminals through the selected fuse element and selectively measuring a voltage drop across the selected fuse element through the pair of test terminals.
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