Techniques for developing integrated circuit test programs and their use in testing actual circuits
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 29, 1995
Grant Date -
N/A
app pub date -
Aug 1, 1990
filing date -
Aug 1, 1990
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A computer process for developing a test program and data for use on automatic test equipment ('ATE') to test the logical function of actual integrated circuits. The separate trace files usually developed by the designer of a particular circuit in order to simulate the circuit's logical operation are utilized to produce the test program and data for controlling the ATE's testing of that circuit. The computer implemented process for doing so includes separate preliminary processing, related to the trace files but essentially unrelated to the particular ATE used, and post processing, for converting the intermediate results of the preliminary processing into a test program and data for driving a particular type of ATE. The process includes the use of common timing files for data from the plurality of trace files, and conversion of a binary integer representation of timing edges to ASCII characters with a significantly reduced number of bits.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully