Method and apparatus for manufacturing semiconductor devices

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United States of America Patent

PATENT NO 5445676
SERIAL NO

08321745

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Abstract

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A wafer(s) for producing semiconductor devices is subjected to heat treatment in a vertical thermal reactor, which is provided with an electric heating means setting a first temperature and another electric heating means setting a second temperature higher than the first temperature. The wafer(s) is moved upwards and is subjected to a treatment in the second region of the vertical thermal reactor; and, is reverted to the first region. Rapid thermal processing of 6 or 8 inch wafer(s) is possible without causing slip lines.

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Patent Owner(s)

Patent OwnerAddress
F T L CO LTDKAWASAKI-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takagi, Mikio Kanagawa, JP 46 1268

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