Apparatus for drawing paste pattern on substrate

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United States of America Patent

PATENT NO 5437727
SERIAL NO

07917934

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Abstract

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An apparatus for drawing a pattern of a photoresist on a substrate has a nozzle for discharging the paste and a substrate-supporting table movable along the X and Y-axes relative to the paste drawing opening of the nozzle. The nozzle is fixed to a Z-axis table which carries an optical displacement meter which measures the clearance between the substrate and the paste discharging opening. According to the results of the measurements, the Z-axis table is moved toward and away from the substrate so that the clearance is maintained at a desired distance. The optical displacement meter has a measuring point on the substrate. The measuring point is positioned so as not to interfere with the paste line which is drawn on the substrate with paste discharged from the nozzle.

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Patent Owner(s)

Patent OwnerAddress
HITACHI TECHNO ENGINEERING CO LTD A CORP OF JAPAN13-17 NAKAGAWA-4-CHOME ADACHI-KU TOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishida, Shigeru Shimoinayoshi, JP 24 208
Mishina, Haruo Ushiku, JP 20 372
Yoneda, Tomio Shimoinayoshi, JP 4 109

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