Mass spectrometry method with two applied trapping fields having same spatial form

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United States of America Patent

PATENT NO 5436445
SERIAL NO

08252436

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Abstract

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A mass spectrometry method in which an improved field comprising two or more trapping fields having substantially identical spatial form is established and at least one parameter of the improved field is changed to excite selected trapped ions sequentially for detection. The changing improved field (preferably with a supplemental field superimposed therewith) can sequentially eject selected ones of the trapped ions from the improved field for detection. An improved field comprising two quadrupole trapping fields can be established in a region defined by the ring and end electrodes of a three-dimensional quadrupole ion trap, and the amplitude of an RF (and/or DC) component (and/or the frequency of the RF component) of one or both trapping fields can be changed to sequentially excite trapped ions. Preferably, a trapping field capable of storing ions having mass to charge ratio within a selected range is established, an improved field is established by superimposing the trapping field with a second trapping field of substantially identical spatial form, and a supplemental field is also superimposed with the trapping field to cause at least some of the trapped ions in the trap region to move away from the center of the trap region.

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Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATIONKYOTO JAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kelley, Paul E San Jose, CA 25 788
Louris, John N Santa Clara, CA 10 336

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