Reduction of image artifacts caused by unwanted photons

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5434414
SERIAL NO

07889406

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A system for recording fewer of the events that are caused either by Compton scatter photons or by gamma radiation interacting with lead. The system locally determines the energy spectrum and fits the determined energy spectrum with a trial function composed of a photopeak component of known energy shape, but unknown magnitude and a Compton scatter component having a theoretically derived energy shape and an unknown magnitude for each pixel of the image. The trial function is locally fitted to the measured energy spectrum to obtain the values of both the Compton Coefficient and the gamma radiation interacting with lead. This enables removal of Compton contamination and also the contamination caused by interaction of the gamma photons with lead components.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ELSCINT LTDPOB 5258 HAIFA A CORP OF ISRAEL

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Berlad, Gideon Haifa, IL 25 612
Maor, Dov Haifa, IL 19 2180
Shrem, Yigal Haifa, IL 10 189
Soil, Adrian Haifa, IL 3 55

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation