Method and apparatus for detecting abnormality in analog-to-digital converter
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United States of America Patent
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-
Jul 11, 1995
Grant Date -
N/A
app pub date -
Dec 9, 1993
filing date -
Dec 14, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A reference voltage for an analog-to-digital (A/D) converting unit is converted into plural digital values through the effect of the A/D converting unit. A difference between an average value of the digital values and an ideal reference value is derived. If the different is larger than a predetermined allowable value, it is determined that a transient abnormality takes place in an A/D converter system. The last measured reference voltage and its related digital input signal are disallowed to be used as measured values. If detection of a transient abnormality serially takes place predetermined times, it is determined that a constant abnormality takes place in the A/D converter system.
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