Device for measuring, at a plurality of points of a surface, the microwave field radiated by a source
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United States of America Patent
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Jul 4, 1995
Grant Date -
N/A
app pub date -
Jan 11, 1993
filing date -
Jun 14, 1990
priority date (Note) -
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Abstract
An antenna (3) charged by a diode (4) is arranged at each of the points of a surface (30). The source (1) and a collecting antenna (5) are arranged on the same side of this surface, in the vicinity of each other. A layer (32) of absorbent material is provided, one face of which fits the shape of the surface (30) and is arranged on the side of said surface (30) opposite that of the source (1) and of the collecting antenna (5). An addressing circuit (33) of the diodes (4) which fits the shape of the other face of the absorbent layer (32) is connected, via connections which pass through said layer (32) perpendicular to the surface (30), to each of the diodes (4). The use of the modulated diffusion method permits the measurement of the near field radiated by a transmission antenna or diffracted by an object illuminated by a microwave radiation.
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