Method of testing aspherical optical surfaces with an interferometer
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United States of America Patent
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May 16, 1995
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app pub date -
Oct 15, 1993
filing date -
Oct 15, 1993
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Abstract
A Fizeau interferometer (10) producing spherical test and reference wavefronts (34 and 36) is operated with a linear translator (50) for making a sequence of subaperture measurements of an aspherical test surface (40). Separate phase maps (88 and 90) are assembled at different focus positions (54 and 56) along a common optical axis (52) of the interferometer (10) and aspherical test surface (40). Respective null zones (92 and 94) are isolated from the phase maps (88 and 90) and are combined to form a composite phase map (100) defining differences between the aspherical test surface (40) and a family of spheres.
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