Integrated apparatus for mapping and characterizing the chemical composition of surfaces

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United States of America Patent

PATENT NO 5416321
SERIAL NO

08043722

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus which accurately maps and detects contaminants within interior surfaces is provided. The apparatus finds use in supporting decontamination operations by providing on-site chemical analyses defining the condition of contaminated areas and monitoring the progress of clean-up operations. An optical vision system is used to accurately map the surface to be investigated or treated as a reference. Analytical probes are used to sample the mapped surface to detect inorganic and organic contaminants in situ. Automated controls which manipulate the analytical probes and high speed analytical equipment, such as a high speed gas chromatograph, are optionally used to take large numbers of samples quickly and remotely. The optical vision system tracks the position of the analytical probes, providing an accurate map of the location of the contaminants. The precise positioning of the contaminants and ease of sampling allows for more accurate characterization of the surfaces before, after, and during clean-up operations. The real-time analysis of the inspection sites also eliminates unnecessary and wasteful clean-up activity.

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Patent Owner(s)

Patent OwnerAddress
CYTERRA CORPORATION85 FIRST AVENUE WALTHAM MA 02451

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beck, Buddy G Fairfax Station, VA 3 221
Sebastian, Richard L Mason Neck, VA 45 1137

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