Semiconductor element manufacturing method

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United States of America Patent

PATENT NO 5365875
SERIAL NO

07946645

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Abstract

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An object of this invention is to provide a semiconductor element manufacturing method in which, in forming a polycrystal semiconductor layer by applying ultraviolet rays to an amorphous semiconductor layer formed on a large substrate, an excimer laser employed in the conventional art is used in such a manner that the layer is made uniform in crystallinity, thereby to manufacture a polycrystal semiconductor layer high in quality. According to the present invention, in a semiconductor element manufacturing method comprising a step of applying an excimer laser beam providing a beam spot having a predetermined irradiation area to an amorphous semiconductor layer formed on an insulating substrate to crystallize the amorphous semiconductor layer to obtain a polycrystal semiconductor layer, the beam spot is moved over said amorphous semiconductor layer in a scanning mode while being shifted with a pitch of at most 1 mm, so that all the parts of the semiconductor layer are substantially equal to one another in the energy applied thereto.

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Patent Owner(s)

Patent OwnerAddress
FUJI XEROX CO LTD9-7-3 AKASAKA MINATO-KU TOKYO 107-0052

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asai, Ichirou Kanagawa, JP 5 197
Fuse, Mario Kanagawa, JP 55 415
Kato, Noriji Kanagawa, JP 63 792

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