Automatic transistor checker
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United States of America Patent
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Oct 11, 1994
Grant Date -
N/A
app pub date -
Mar 27, 1992
filing date -
Mar 27, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An automatic transistor checking method is provided, whereby an unknown, bipolar transistor may be typed, pinned and checked for forward DC gain, H.sub.fe. The method is suitable for portable instruments, because the method uses little battery current to perform the H.sub.fe measurement. The method automatically determines transistor type (NPN or PNP) and pinout, making it suitable for quick checking of batches of unknown devices.
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