Method of measuring artifact taper
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United States of America Patent
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Sep 20, 1994
Grant Date -
N/A
app pub date -
Mar 24, 1993
filing date -
Mar 24, 1993
priority date (Note) -
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Abstract
An interferometer (14) performs three topographical measures of an artifact (12) to determine taper between opposing surfaces (50 and 52) of the artifact (12) mounted on three points of support (30, 32, and 34). Two sets of three data points (60, 62, and 64 and 68, 70, and 72) are extracted from the first topographical measure and are used to calculate irregularities in one of the opposing surfaces (50). The second two topographical measures are made of the other artifact surface (52). Taper between the opposing surfaces (50 and 52) is calculated independently of both the surface irregularities and any angular deviations of the three points of support (30, 32, and 34).
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Cited Art Landscape
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