Method and device for in-phase excitation of ion ejection from ion trap mass spectrometers

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United States of America Patent

PATENT NO 5347127
SERIAL NO

07996058

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Abstract

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An improvement of a fast scanning method in an ion trap mass spectrometer comprises setting the frequency and phase relationships between the ion trap storage frequency and the ion trap excitation frequency in such a way that the ions of consecutive masses each gain precisely the same 'phase rhythm' or 'phase sequence'. The phase rhythm, or the historical succession of phase positions up to ion ejection, is optimally set in accordance with nonlinear resonance conditions used to cause ion ejection. The excitation voltage frequency is set to a value somewhat smaller that an integral fraction of the storage voltage frequency and the scan profile is set based on the excitation frequency so that the same time is required for ions of each mass to be ejected and so that precisely an integer number of cycles of the excitation frequency is used per mass.

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Patent OwnerAddress
BRUKER-FRANZEN ANALYTIK GMBHKATTENTURMER HEERSTRASSE 122 D-2800 BREMEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Franzen, Jochen Bremen, DE 156 4040

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