Positive diazo quinone photoresist compositions containing antihalation compound

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United States of America Patent

PATENT NO 5334481
SERIAL NO

07692811

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Abstract

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Addition of compounds of formula I ##STR1## in which R.sup.1 to R.sup.4 are each hydroxyl or C.sub.1-6 -alkoxy and R.sup.5 to R.sup.10 are each hydrogen or C.sub.1-6 -alkyl, to positive photoresist compositions based on a diazoquinone/novolak resin effectively suppresses stray radiation and halation effects in corresponding photoresist coatings, in particular if these coatings have been applied to highly reflective substrates.

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Patent Owner(s)

Patent OwnerAddress
OLIN MICROELECTRONIC CHEMICALS INCP O BOX 4500 501 MERRITT 7 NORWALK CT 06856

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Merrem, Hans J Seeheim, DE 5 33

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