Apparatus for measuring particulate size without contacting the particulate
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United States of America Patent
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Jul 5, 1994
Issued Date -
N/A
app pub date -
Jun 21, 1993
filing date -
Apr 5, 1989
priority date (Note) -
Expired
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Abstract
An apparatus is described for measuring the size of a particulate, without contacting the particulate, and therefore without extra forces on the particulate. Stripped gaps of interference fringes are measured behind the particulate when a monochromatic beam is radiated on the particulate.
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