Electron imaging band pass analyser for a photoelectron spectromicroscope
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United States of America Patent
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Jun 14, 1994
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N/A
app pub date -
Sep 30, 1992
filing date -
Jul 9, 1988
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Expired
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Abstract
A low pass filter for use in an image band pass filter of a photoelectron spectromicroscope incorporating a virtual potential surface for reflecting electrons below a particular energy and a special charged particle trap or super dump for unwanted electrons. The filter construction with the super dump reduces the proportion of elastically and inelastically scattered high energy electron escaping the filter.
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