Method for calibrating a wall thickness inspection machine
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United States of America Patent
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-
Apr 12, 1994
Grant Date -
N/A
app pub date -
Mar 19, 1991
filing date -
Mar 19, 1991
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A computer senses a voltage which is representative of wall thickness and defines with the use of a voltage/thickness curve the thickness of that wall portion. To define this curve, a plurality of voltage/thickness points are inputted by a sensor into the computer Each point is defined by sensing and defining the voltage of a wall portion on a calibration standard having a known thickness and defining a calibration thickness corresponding to that voltage using the following equation {((Calibration Standard Diameter in inches -Container Diameter in inches).times.0.2)+1}.times.Calibration Standard Thickness in mils, and equating these calibration thicknesses to the corresponding voltages produced by the sensor when sensing at least two thicknesses of the standard.
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