Reduction of image artifacts caused by Compton scatter
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United States of America Patent
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-
Mar 8, 1994
Grant Date -
N/A
app pub date -
May 15, 1991
filing date -
Jun 11, 1990
priority date (Note) -
Expired
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Abstract
Correction for Compton scattering is effected by analysis of the energy spectra. More particularly, a measured energy spectrum is constructed per location from detected counts that are stored according to their measured energy as well as according to the location of gamma ray infingement on a scintillating detector. The measured spectrum comprises scattered and unscattered photons. A physically correct trial function enables the separation of overlapping contributions of scattered and unscattered photons. The trial function includes multiple collision terms that are preferably constructed using the Nishina-Klein equations describing photon Compton scatter probability distributions. The count of unscattered photons per location is derived from the measured spectrum by locally fitting to the trial function. The count of the unscattered photons per location is used to produce the improved images with reduced artifacts caused by Compton scatter.
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