Method for control of photoresist develop processes

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United States of America Patent

PATENT NO 5292605
SERIAL NO

07957660

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Abstract

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A method for the control of photoresist develop processes employing multiple spray-puddle steps in which process changes other than time, such as endpoint are used to determine the length of the spray and puddle steps.

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Patent Owner(s)

Patent OwnerAddress
LUXTRON CORPORATION3033 SCOTT BOULEVARD SANTA CLARA CA 95054-3316

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Thomson, Mariste A Santa Clara, CA 3 129

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