Scanning force microscope with integrated optics and cantilever mount
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 8, 1994
Grant Date -
N/A
app pub date -
Mar 4, 1992
filing date -
Mar 4, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The scanning force microscope includes integrated optics for viewing the optical lever arm, probe and sample to be examined. The scanning force microscope includes an improved mount for the probe, which is magnetically secured to the body of the scanning force microscope, to improve ease of handling and mounting the probe assembly. In one preferred embodiment the scanning force microscope, also includes a base portion with a fluid cell for receiving a sample in a sealed gas or liquid environment.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully