Method of estimating logic cell delay time

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United States of America Patent

PATENT NO 5274568
SERIAL NO

07623310

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Abstract

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A method for approximating the delay time of an excitation through a logic cell using the summation of a base delay, which is a function of delay coefficients for the cell and the total output load capacitance of the cell, and a rise/fall time correction, which is determined from the output rise/fall time of the driving cell and the sensitivity of the analyzed cell to rise/fall time. Other corrections/compensating factors include a performance derating factor which accounts for the multiplicative effects of operating voltage, temperature and process.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blinne, Richard D Fort Collins, CO 11 177
Holzer, Jr Richard J Fort Collins, CO 1 52
Laubhan, Richard A Fort Collins, CO 5 137
Ouellette, Timothy R Greeley, CO 1 52
Ozman, Rhea R Fort Collins, CO 1 52
Scott, John Fort Collins, CO 106 1042

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