Molecular imaging system
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United States of America Patent
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Dec 21, 1993
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N/A
app pub date -
May 21, 1992
filing date -
May 21, 1992
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Abstract
An ion-beam based system enables quantitative analysis and visualization of a sample with atomic and molecular specificity. The system comprises a liquid metal ion source that directs a tightly focused beam of ions at the sample, the beam having an ion density that is insufficient to materially change the surface properties of the sample. A controller connected to the liquid metal ion source gates on the ion beam for a period of time that is sufficient to enable the ion source to achieve a tight focus of the beam at the sample and for further scanning the ion beam across the sample. A laser beam is positioned over the sample and has a wavelength that resonantly ionizes components of the sample that are liberated by action of the scanned ion beam. A detector measures the liberated ionized components and is connected to a display system that provides an image of the distribution of the species on surface of the sample.
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