Microprocessor controlled system for testing and selectively reconditioning a CRT
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United States of America Patent
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Nov 9, 1993
Grant Date -
N/A
app pub date -
Oct 15, 1992
filing date -
Oct 15, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A microprocessor controlled system for testing and selectively reconditioning a CRT in accordance with the Beltron process. The microprocessor monitors the function and filament voltage selection switches actuated by an operator. Once the filament voltage and functions have been specified, the microprocessor automatically controls the application of filament voltage, AC voltage and relatively high DC voltage to the CRT and displays the progress and results of the selected function. The system tests the emission characteristics of the cathode in each gun element, causes simultaneous cleaning of the cathode/grid elements by controlling the application of an AC voltage across each cathode/grid circuit while the filament voltage is at an elevated level, and restores those cathode/grid circuits requiring restoration by controlling the application of a relatively high DC voltage to each cathode/grid circuit in serial fashion for the several gun elements while maintaining the filament voltage at an elevated level. The system substantially reduces required operator interaction with the testing and reconditioning procedure and provides a commensurate reduction in the probability of destruction of a CRT by operator error.
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