Defect detection method

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United States of America Patent

PATENT NO 5245424
SERIAL NO

07823328

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Abstract

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An image of a light irradiated object is picked up by a video camera. Detection of defects on the object is conducted from the image signal from the video camera. Two inspection zones adjacent each other are established on the picture screen, each having a preset size. The brightness of each of the respective two inspection zones is sensed and accumulated as the inspection zones are indexed across the screen. When the difference between the accumulated values of the respective inspection zones exceeds a preset threshold value a defect is defined.

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Patent Owner(s)

Patent OwnerAddress
HAJIME INDUSTRIES LTDKUDAN SANZEN BLDG 5-9 KUDAN MINAMI 2-CHOME CHIYODA-KU TOKYO JAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yoshida, Hajime Tokyo, JP 136 1444

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