Substrate heating method utilizing heating element control to achieve horizontal temperature gradient

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United States of America Patent

PATENT NO 5239614
SERIAL NO

07791545

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Abstract

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A heat-treating method comprising preparing a plurality of wafers parallel to one another in a process tube while keeping their surfaces to be treated substantially horizontal, arranging plural MoSi.sub.2 wire heaters along the longitudinal axis of the process tube so as to be placed around the process tube, adjusting the amount of current supplied to the heaters to form on the treated surface of each of the wafers temperature gradient extending from one side of the outer circumferential rim of each of the wafers to the other side thereof, and rotating the wafers in their surfaces.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAKANAGAWA-KEN
TOKYO ELECTRON SAGAMI LIMITED3210-1 AZAHONGO KAWASHIRI SHIROYAMA-MACHI TSUKUI-GUN KANAGAWA 220-01

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Imai, Keitaro Kawasaki, JP 72 1875
Nakao, Ken Sagamihara, JP 50 1531
Ueno, Seiko Mizusawa, JP 1 15
Yamabe, Kikuo Yokohama, JP 21 667

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