Reflectance infrared microscope having high radiation throughput
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United States of America Patent
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Aug 24, 1993
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N/A
app pub date -
Jun 3, 1991
filing date -
Sep 16, 1986
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Abstract
An infrared microscope is disclosed which provides illumination for reflectance by the sample. This illumination follows a path through the objective toward the sample, and again, after reflection, through the objective toward the detector The reflectance illumination is directed toward the objective and sample by a fully reflective mirror, which injects approximately half of the interferometer beam into the microscope, and permits substantially all of the reflected beam to reach the detector.
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