Method and apparatus for imaging of an atomic environment
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United States of America Patent
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Jul 13, 1993
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N/A
app pub date -
Aug 20, 1990
filing date -
Aug 20, 1990
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Expired
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Abstract
A method and apparatus for imaging of an atomic environment are disclosed. The method includes detecting and measuring the intensity of a diffuse low energy electron diffraction pattern. The diffraction pattern may be formed by directing a beam of electrons against the surface of a sample, or by directing a beam of X-rays against the surface of a sample. The diffraction pattern may be energy-filtered to obtain a diffraction pattern corresponding to the lower energy electrons emitted by the surface. Data corresponding to reconstructed amplitudes of a waveform is generated by operating on the intensity data. The data corresponding to the reconstructed amplitude is capable of being displayed as a variety of slices or two-dimensional planes of the three-dimensional image of an atomic environment, and is capable of being displayed holographically.
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